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Volumn 36, Issue 13, 1997, Pages 2956-2962

Scattering by layered structures with rough surfaces: Comparison of polarimetric optical scatterometer measurements with theory

Author keywords

Mueller matrix; Optical detection; Rough surfaces; Scatterometer measurements; Stratified media

Indexed keywords

CALCULATIONS; GLASS; LIGHT REFLECTION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTICAL DEVICES; OPTICAL VARIABLES MEASUREMENT; SILICON WAFERS; SURFACE ROUGHNESS;

EID: 0031146901     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.002956     Document Type: Article
Times cited : (2)

References (15)
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  • 6
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  • 13
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    • Chemical Research, Development and Engineering Center, U.S. Army Armament, Munitions and Chemical Command, Aberdeen Proving Ground, Md
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  • 14
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.