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Volumn 18, Issue 5, 1997, Pages 194-196

Monolithic CMOS digital integrated circuits in 6H-SiC using an implanted p-well process

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC INVERTERS; LOGIC CIRCUITS; MOSFET DEVICES; THERMODYNAMIC STABILITY;

EID: 0031146793     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.568759     Document Type: Article
Times cited : (23)

References (6)
  • 1
    • 0028539636 scopus 로고
    • Monolithic NMOS digital integrated circuits in 6H-SiC
    • Nov.
    • W. Xie, J. A. Cooper, Jr., and M. R. Melloch, "Monolithic NMOS digital integrated circuits in 6H-SiC," IEEE Electon Device Lett., vol. 15, pp. 455-457, Nov. 1994.
    • (1994) IEEE Electon Device Lett. , vol.15 , pp. 455-457
    • Xie, W.1    Cooper Jr., J.A.2    Melloch, M.R.3
  • 2
    • 3743100132 scopus 로고    scopus 로고
    • Design and fabrication of depletion load NMOS integrated circuits in 6H-SiC
    • IOP Publishing Ltd., ser. no. 142, ch. 4
    • S. Ryu and K. T. Kornegay, "Design and fabrication of depletion load NMOS integrated circuits in 6H-SiC," in Inst. Phys. Conf., IOP Publishing Ltd., 1996, ser. no. 142, ch. 4, pp. 789-792.
    • (1996) Inst. Phys. Conf. , pp. 789-792
    • Ryu, S.1    Kornegay, K.T.2
  • 4
    • 0029712045 scopus 로고    scopus 로고
    • Demonstration of a 6H-SiC CMOS technology
    • June 24-26
    • _, "Demonstration of a 6H-SiC CMOS technology," in 54th Annu. Dev. Res. Conf. Dig., June 24-26 1996, pp. 162-163.
    • (1996) 54th Annu. Dev. Res. Conf. Dig. , pp. 162-163
  • 5
    • 36449003822 scopus 로고
    • Empirical depth profile simulator for ion implantation in 6H α-SiC
    • June
    • S. Ahmed, C. J. Barbero, T. W. Sigmon, and J. W. Erickson, "Empirical depth profile simulator for ion implantation in 6H α-SiC," J. Appl. Phys., vol. 77, no. 12, pp. 6194-6220, June 1995.
    • (1995) J. Appl. Phys. , vol.77 , Issue.12 , pp. 6194-6220
    • Ahmed, S.1    Barbero, C.J.2    Sigmon, T.W.3    Erickson, J.W.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.