Analysis of Fatigue Data with Runouts Based on a Model with Nonconstant Standard Deviation and a Fatigue Limit Parameter

Journal of Testing and Evaluation

Volumn 25, Issue 3, 1997, Pages 292-301

  Pascual, Francis G ^a   Meeker, William Q ^a  

^a Iowa State University   (United States)

Author keywords

Fatigue curves; Fatigue data; Fatigue life distribution; Fatigue limit; Maximum likelihood methods; Nonconstant standard deviation; Runouts

Indexed keywords

ESTIMATION; MATHEMATICAL MODELS; STATISTICAL METHODS; STRESSES;

FATIGUE DATA; FATIGUE LIMIT PARAMETER; MAXIMUM LIKELIHOOD METHODS; NONCONSTANT STANDARD DEVIATION; RUNOUTS;

FATIGUE OF MATERIALS;

EID: 0031146655     PISSN: 00903973     EISSN: None     Source Type: Journal    
DOI: 10.1520/jte11341j     Document Type: Article

References (4)

1. Nelson, W., "Fitting of Fatigue Curves with Nonconstant Standard Deviation to Data with Runouts," Journal of Testing and Evaluation, Vol. 12, 1984, pp. 69-77.
2. Nelson, W., Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley & Sons, New York, 1990.
3. Hirose, H., "Estimation of Threshold Stress in Accelerated Life-Testing." IEEE Transactions on Reliability, Vol. 42, 1993, pp. 650-657.
4. Ostrouchov, G. and Meeker, W., "Accuracy of Approximate Confidence Bounds Computed from Interval Censored Weibull and Lognormal Data," Journal of Statistical Computing and Simulations, Vol. 29, 1988, pp. 43-76.