메뉴 건너뛰기




Volumn 380, Issue 2-3, 1997, Pages 245-257

X-ray reflectivity study on gold films during sputter deposition

Author keywords

Atomic force microscopy; Gold; Growth; Metallic films; Metallic surfaces; Models of non equilibrium phenomena; Non equilibrium thermodynamics and statistical mechanics; Polycrystalline surfaces; Polycrystalline thin films; Scanning tunneling microscopy

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; FILM GROWTH; MATHEMATICAL MODELS; METALLIC FILMS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SPUTTER DEPOSITION; STATISTICAL MECHANICS; SURFACE ROUGHNESS; THERMODYNAMICS;

EID: 0031146482     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01406-9     Document Type: Article
Times cited : (9)

References (35)
  • 16
    • 0000453074 scopus 로고
    • J.M. Kim and J.M. Kosterlitz, Phys. Rev. Lett. 62 (1989) 2289; J.M. Kim, J.M. Kosterlitz and T. Ala-Nissila, J. Phys. A: Math. Gen. 24 (1991) 5569.
    • (1989) Phys. Rev. Lett. , vol.62 , pp. 2289
    • Kim, J.M.1    Kosterlitz, J.M.2
  • 35
    • 30244526640 scopus 로고    scopus 로고
    • Unpublished
    • Unpublished.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.