Spectral sensitivity of the VLEED to the bonding geometry and the potential barrier of the O-Cu(001) surface

Vacuum

Volumn 48, Issue 5, 1997, Pages 491-498

  Sun, Chang Q ^a  

^a MURDOCH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

VERY LOW ENERGY ELECTRON DIFFRACTION (VLEED);

CHEMICAL BONDS; COPPER; DAMPING; ELASTICITY; LOW ENERGY ELECTRON DIFFRACTION; NONDESTRUCTIVE EXAMINATION; OXYGEN;

SURFACE STRUCTURE;

EID: 0031146362     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(96)00298-9     Document Type: Article

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