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Volumn 380, Issue 2-3, 1997, Pages

New experimental technique of photoelectron holography applied to Bi trimers on Si(111)

(4) Roesler, J M a Sieger, M T a Miller, T a Chiang, T C a

a University of Illinois at Urbana Champaign (United States)

Author keywords

Angle resolved photoemission; Bismuth; Photoelectron holography; Silicon; Single crystal surfaces; Soft X ray photoelectron spectroscopy (using synchrotron radiation); Surface structure, morphology, roughness, and topography

Indexed keywords

ADSORPTION; CRYSTAL ATOMIC STRUCTURE; HOLOGRAPHY; MONOLAYERS; MORPHOLOGY; OSCILLATIONS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SILICON; SURFACE STRUCTURE;

ANGLE RESOLVED PHOTOEMISSION; PHOTOELECTRON HOLOGRAPHY;

BISMUTH;

EID: 0031146071 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(96)01562-2 Document Type: Article

Times cited : (12)

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