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Volumn 380, Issue 2-3, 1997, Pages 258-263

Ag growth on Si(111) with an Sb surfactant investigated by scanning tunneling microscopy

Author keywords

Antimony; Heterojunctions; Scanning tunneling microscopy; Silicon; Silver; Surface structure, morphology, roughness, and topography

Indexed keywords

ANTIMONY; COALESCENCE; CRYSTAL ORIENTATION; DIFFUSION IN SOLIDS; FILM GROWTH; METALLIC FILMS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE ACTIVE AGENTS; SURFACE ROUGHNESS; ULTRATHIN FILMS;

EID: 0031145082     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01573-7     Document Type: Article
Times cited : (19)

References (24)
  • 7
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    • B.D. Yu and A. Oshiyama, Phys. Rev. Lett. 71 (1993) 585; 72 (1994) 3190.
    • (1994) Phys. Rev. Lett. , vol.72 , pp. 3190
  • 18
    • 84927444420 scopus 로고
    • St. Tosch and H. Neddermeyer, Phys. Rev. Lett. 61 (1988) 349; J. Microsc. 152 (1988) 415.
    • (1988) J. Microsc. , vol.152 , pp. 415
  • 24
    • 30244460594 scopus 로고    scopus 로고
    • note
    • In our recent LEED study of Ag growth on the 1 ML (√3 × √3)-Sb/Si(111) surface at room temperature, we observed the weak, original (√3 × √3) pattern plus the (1 × 1) pattern of slightly rotated Ag(111) islands from the Si(111) orientation even in 3 ML of the Ag film.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.