Laser diodes in photon number squeezed state

IEEE Journal of Quantum Electronics

Volumn 33, Issue 5, 1997, Pages 824-830

  Kakimoto, Syoichi ^a,b,c,d   Shigihara, Kimio ^a,b,d,e   Nagai, Yutaka ^a,f,g  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c Institute of Electronics   (Japan)

^d JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^e UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^f KOBE UNIVERSITY   (Japan)

^g Mitsubishi Electric Corporation ^*

Author keywords

AM noise; Laser noise; Noise; Optical noise; Semiconductor lasers; Shot noise

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC SPACE CHARGE; SEMICONDUCTING ALUMINUM COMPOUNDS; SHOT NOISE; SPECTRUM ANALYSIS; TUNNEL DIODES;

BANDGAP ENERGY; FANO FACTOR; LANGEVIN METHOD;

SEMICONDUCTOR LASERS;

EID: 0031144737     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.572157     Document Type: Article

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