Yield enhancement for a low-voltage microcontroller

Semiconductor International

Volumn 20, Issue 5, 1997, Pages

  Ku, Jeng Wang ^a   Chao, Su C ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC VARIABLES MEASUREMENT; MOSFET DEVICES; OXIDES; PROM;

ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY (EEPROM) DESIGN;

MICROPROCESSOR CHIPS;

EID: 0031144736     PISSN: 01633767     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)