Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors

Applied Physics Letters

Volumn 70, Issue 20, 1997, Pages 2673-2675

  Chen, Erli ^a   Chou, Stephen Y ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAM LITHOGRAPHY; FUSED SILICA; LIGHT POLARIZATION; LIGHT TRANSMISSION; OPACITY; PHOTODETECTORS; POLARIMETERS; RESONANCE;

FINGER SPACINGS; METAL SEMICONDUCTOR METAL PHOTODETECTORS; MODAL EXPANSION THEORY; THIN METAL TRANSMISSION GRATINGS;

DIFFRACTION GRATINGS;

EID: 0031144467     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118990     Document Type: Article

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