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Volumn 60, Issue 1-3, 1997, Pages 244-248

Surface quality of {111} side-walls in KOH-etched cavities

Author keywords

Potassium hydroxide; Side walls; Silicon pressure sensors; Surface quality

Indexed keywords

ETCHING; POTASSIUM COMPOUNDS; STRESSES; SURFACES;

EID: 0031144259     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(97)01495-7     Document Type: Article
Times cited : (14)

References (12)
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    • (1989) IEEE Trans. Electron Devices , vol.ED-36 , pp. 663-669
    • Kloeck, B.1    Collins, S.D.2    De Rooij, N.F.3    Smith, R.L.4
  • 3
    • 30244502522 scopus 로고
    • Effect of solution contamination on etched silicon surfaces
    • Pisa, Italy, 5-6 Sept.
    • T.A. Kwa and R.F. Wolfenbuttel, Effect of solution contamination on etched silicon surfaces, Workshop Digest, MME '94, Pisa, Italy, 5-6 Sept. 1994, pp. 36-39.
    • (1994) Workshop Digest, MME '94 , pp. 36-39
    • Kwa, T.A.1    Wolfenbuttel, R.F.2
  • 7
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    • Effect of oxidizing ambient on oxygen precipitation in silicon crystals
    • M. Kohketsu and S. Isomae, Effect of oxidizing ambient on oxygen precipitation in silicon crystals, Jpn. J. Appl. Phys., 30 (1991) L1337-L1339.
    • (1991) Jpn. J. Appl. Phys. , vol.30
    • Kohketsu, M.1    Isomae, S.2
  • 8
    • 0029233451 scopus 로고
    • Atomic scale simulation of silicon etched in aqueous KOH solution
    • H. Camon and Z. Moktadir, Atomic scale simulation of silicon etched in aqueous KOH solution, Sensors and Actuators A, 46-47 (1995) 27-29.
    • (1995) Sensors and Actuators A , vol.46-47 , pp. 27-29
    • Camon, H.1    Moktadir, Z.2
  • 9
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    • personal communication
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    • Mechanisms of transition-element-gettering in silicon
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    • Gilles, D.1
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    • Phosphorus diffusion gettering of gold in silicon: The reversibility of the gettering process
    • E.Ö. Sveinbjörnsson, O. Engström and U. Södervall, Phosphorus diffusion gettering of gold in silicon: the reversibility of the gettering process, J. Appl. Phys., 73 (1993) 7311-7321.
    • (1993) J. Appl. Phys. , vol.73 , pp. 7311-7321
    • Sveinbjörnsson, E.Ö.1    Engström, O.2    Södervall, U.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.