Surface plasmons excited in thin metallic films affected by the size effect

Applied Physics A: Materials Science and Processing

Volumn 64, Issue 5, 1997, Pages 439-444

  Kao, C H ^a   Lue, J T ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CURRENT DENSITY; ELECTRODYNAMICS; ELECTRON SCATTERING; ELECTRONS; INTERFACES (MATERIALS); METALLIC FILMS; RESONANCE; SURFACES;

BOLTZMANN EQUATION; LUCAS BOUNDARY CONDITION; SIZE EFFECT; SURFACE PLASMON;

ULTRATHIN FILMS;

EID: 0031143695     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

1. K. Kretschmann: Z. Phys. 241, 313 (1971)
2. M.S.P. Lucas: J. Appl. Phys. 36, 1632 (1985)
3. J. Szczyrbowski: Phys. Rev. B 32, 763 (1985)
4. J.C. Quail, H.J. Simon: Phys. Rev. B 31, 4900 (1985)
5. C.C. Tzeng, J.T. Lue: Phys. Rev. A 39, 191 (1989)
6. Y.S. Hor, J.T. Lue: Surface Science 304, 375 (1994)
7. H. Raether: Surface Plasmons on Smooth and Rough Surface and on Grattings (Springer, Berlin 1988) p.11
8. Y.S. Hor, J.T. Lue: Appl. Phys. B 62, 303 (1996)
9. A.C. Mathewson, H. Aronsson, L.G. Bemland: J. Phys. F. Metal Phys. 2, L39 (1972)
10. I. Pockrand: Surf. Science, 72, 577 (1978)
11. H. Raether: op. cit. p.22
12. F. Abeles, Y. Borenztein, M. de Crescenzic, T. Rios: Surface Science 101, 123 (1980)
13. W.C. Huang, J.T. Lue: Phys. Rev. B 49, 17279 (1994)