Cesium-induced reconstruction on Si(113)3 × 2 surface studied by low energy electron diffraction and X-ray photoelectron spectroscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 5 A, 1997, Pages 2833-2836

  An, Ki Seok ^a   Hwang, Chan Cuk ^a   Park, Rae Jun ^a   Lee, Ju Bong ^a   Kim, Jeong Seon ^a   Park, Chong Yun ^a   Lee, Soon Bo ^a   Kimura, Akio ^b   Kakizaki, Akito ^b  

^a Sungkyunkwan University   (South Korea)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Alkali metal; Low energy electron diffraction; Si(113); Surface reconstruction; X ray photoelectron spectroscopy

Indexed keywords

SURFACE RECONSTRUCTION;

CESIUM; DEPOSITION; HIGH TEMPERATURE EFFECTS; LOW ENERGY ELECTRON DIFFRACTION; PHASE DIAGRAMS; SATURATION (MATERIALS COMPOSITION); SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

SEMICONDUCTING SILICON;

EID: 0031143053     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.2833     Document Type: Article

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