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Volumn 175-176, Issue PART 1, 1997, Pages 398-403
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Selective area epitaxy of GaAs using very low energy Ga+ focused ion beam deposition combined with molecular beam epitaxial growth
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DEPOSITION;
ION BEAMS;
ION BOMBARDMENT;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
FOCUSED ION BEAM (FIB) DEPOSITION;
HALL MOBILITY;
SELECTIVE AREA EPITAXY;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0031142815
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(96)01028-7 Document Type: Article |
Times cited : (8)
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References (12)
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