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Volumn 175-176, Issue PART 1, 1997, Pages 191-196

Properties of InAs thin films grown on (1 0 0)-oriented GaAs substrate with various tilted angles and directions of misorientation

Author keywords

InAs Hall element; InAs morphology on GaAs; InAs on GaAs; MBE; Thin film

Indexed keywords

CARRIER CONCENTRATION; HALL EFFECT DEVICES; MOLECULAR BEAM EPITAXY; MOLECULAR ORIENTATION; MORPHOLOGY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR GROWTH; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS;

EID: 0031142750     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00956-6     Document Type: Article
Times cited : (5)

References (7)
  • 1
    • 30244548124 scopus 로고
    • Tech. Dig. IEE, Tokyo
    • I. Shibasaki, The 8th Sensor Symp. C3-1, Tech. Dig. (IEE, Tokyo, 1989) p, 211.
    • (1989) The 8th Sensor Symp. , vol.C3-1 , pp. 211
    • Shibasaki, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.