Stress release at Y2BaCuO5 inclusions in fast melt processed YBa2Cu3O7 - X observed by micro-Raman spectroscopy

Applied Physics Letters

Volumn 70, Issue 21, 1997, Pages 2897-2899

  Provoost, R ^a   Rosseel, K ^a   Moshchalkov, V V ^a   Silverans, R E ^a   Bruynseraede, Y ^a   Dierickx, D ^a   Van Der Biest, O ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; INCLUSIONS; INTERFACES (MATERIALS); PHONONS; RAMAN SPECTROSCOPY; STRESSES;

PINNING CENTERS; YTTRIUM BARIUM COPPER OXIDE;

YTTRIUM COMPOUNDS;

EID: 0031142061     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119046     Document Type: Article

References (15)

1. P. J. Kung, M. P. Maley, M. E. McHenry, J. O. Willis, M. Murakami, and S. Tanaka, Phys. Rev. B 48, 13922 (1993): K. Salama and D. F. Lee, Supercond, Sci. Technol. 7, 177 (1994): B. Martínez, X. Obradors, A. Gou, V. Gomis, S. Piñol, J. Fontcuberta, and H. Van Tol. Phys. Rev. B 53, 2797 (1996).
2. P. J. Kung, M. P. Maley, M. E. McHenry, J. O. Willis, M. Murakami, and S. Tanaka, Phys. Rev. B 48, 13922 (1993): K. Salama and D. F. Lee, Supercond, Sci. Technol. 7, 177 (1994): B. Martínez, X. Obradors, A. Gou, V. Gomis, S. Piñol, J. Fontcuberta, and H. Van Tol. Phys. Rev. B 53, 2797 (1996).
3. P. J. Kung, M. P. Maley, M. E. McHenry, J. O. Willis, M. Murakami, and S. Tanaka, Phys. Rev. B 48, 13922 (1993): K. Salama and D. F. Lee, Supercond, Sci. Technol. 7, 177 (1994): B. Martínez, X. Obradors, A. Gou, V. Gomis, S. Piñol, J. Fontcuberta, and H. Van Tol. Phys. Rev. B 53, 2797 (1996).
4. D. Dierickx, K. Rosseel, W. Boon. V. V. Moshchalkov. Y. Bruynseraede, and O. Van der Biest. Applied Superconduclivity 1995, Proceedings of EUCAS. 3-6 July 1995, Edinburgh, UK (IOP, Bristol, UK, 1995), pp. 175-8.
5. Y. Ren, R. Weinstein, J. Liu, R. P. Sawh, and C. Foster, Physica C 251, 15 (1995): G. Fuchs, G. Krabbes, P. Schätzle, P. Stoye, T. Staiger, and K.-H. Müller, Physica C 268, 115 (1996).
6. Y. Ren, R. Weinstein, J. Liu, R. P. Sawh, and C. Foster, Physica C 251, 15 (1995): G. Fuchs, G. Krabbes, P. Schätzle, P. Stoye, T. Staiger, and K.-H. Müller, Physica C 268, 115 (1996).
7. K. F. McCarty, J. Z. Liu, R. N. Shelton, and H. B. Radousky, Phys. Rev. B 41, 8792 (1990).
8. A. F. Goncharov, M. R. Muinov, T. G. Uvarova, and S. M. Stishov, JETP Lett. 54, 111 (1991); K. Syassen, M. Hanfland, K. Strössner, M. Holtz, W. Kress, M. Cardona, U. Schröder, J. Prade, A. D. Kulkarni, and F. W. De Wette, Physica C 153-155, 264 (1988).
9. A. F. Goncharov, M. R. Muinov, T. G. Uvarova, and S. M. Stishov, JETP Lett. 54, 111 (1991); K. Syassen, M. Hanfland, K. Strössner, M. Holtz, W. Kress, M. Cardona, U. Schröder, J. Prade, A. D. Kulkarni, and F. W. De Wette, Physica C 153-155, 264 (1988).
10. D. Palles, N. Poulakis, E. Liarokapis, K. Conder, E. Kaldis, and K. A. Müller, Phys. Rev. B 54, 6721 (1996).
11. M. V. Abrashev and M. N. Iliev, Phys. Rev. B 45, 8046 (1992).
12. D. H. Ha. I. K. Jeong, E. J. Shin, D. Kim, and Y. K. Park, Jpn. J. Appl. Phys. 33. L510 (1994).
13. D. Dierickx and O. Van der Biest, Eur. J. Solid State Inorg. Chem. 32, 711 (1995).
14. D. Dierickx, I. Houben, J. Lapin, F. Delannay, and O. Van der Biest, J. Mater. Sci. Lett. 15, 1573 (1996).
15. K. Rosseel, J. Vanacken, D. Dierickx, R. Provoost, F. Herlach, R. E. Silverans, V. V. Moshchalkov, and Y. Bruynseraede (unpublished).