Thermovoltage in scanning tunneling microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 3, 1997, Pages 1418-1422

  Hoffmann, D ^a   Haas, A ^a   Kunstmann, T ^a   Seifritz, J ^a   Moller R ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING PROCESS; ANALYTICAL TOOL; AU(1 1 1 ); ENERGY DEPENDENCE; EXTERNAL CURRENTS; FERMI DISTRIBUTION; HETEROGENEOUS SURFACE; LATERAL RESOLUTION; LOCAL VARIATIONS; METALLIC SURFACE; NOBLE METALS; THERMALLY DRIVEN; THERMOVOLTAGE; TUNNELING CURRENT;

ATOMS; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; PRECIOUS METALS; SCANNING TUNNELING MICROSCOPY; ELECTRIC CURRENTS; ELECTRODES; ELECTRON TUNNELING; FERMI LEVEL; VOLTAGE MEASUREMENT;

BIAS VOLTAGE; THERMOELECTRICITY;

THERMOVOLTAGE;

EID: 0031142056     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580553     Document Type: Article

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