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Volumn 41, Issue 5, 1997, Pages 669-671
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Base resistance measurements in HBTs using base-emitter reverse bias breakdown
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC BREAKDOWN OF SOLIDS;
ELECTRIC RESISTANCE MEASUREMENT;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
BASE EMITTER REVERSE BIAS BREAKDOWN;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0031141859
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(96)00250-X Document Type: Article |
Times cited : (1)
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References (4)
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