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Volumn 30, Issue 5, 1997, Pages 102-106

Teaching Taguchi's approach to parameter design

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT; ARRAYS; PRODUCT DESIGN; SIGNAL TO NOISE RATIO; TEACHING;

EID: 0031141575     PISSN: 0033524X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (3)

References (7)
  • 1
    • 0020750263 scopus 로고
    • Off-Line Quality Control in Integrated Circuit Fabrication Using Experimental Design
    • For example, see M.S. Phadke, R.N. Kacker, D.V. Speeney, and M.J. Greico, "Off-Line Quality Control in Integrated Circuit Fabrication Using Experimental Design," Bell System Technical Journal, Vol. 62, No. 5, 1983, pp. 1,273-1,309, or B. Schmidt, H. Dierl, and H. Kaltenbach, "Optimization of IC Chip Bonding Process via Taguchi Methods," in Proceedings of the ASI Fifth Symposium on Taguchi Methods (Dearborn, MI: American Supplier Institute, 1987), pp. 475-485.
    • (1983) Bell System Technical Journal , vol.62 , Issue.5
    • Phadke, M.S.1    Kacker, R.N.2    Speeney, D.V.3    Greico, M.J.4
  • 2
    • 0020750263 scopus 로고
    • Optimization of IC Chip Bonding Process via Taguchi Methods
    • Dearborn, MI: American Supplier Institute
    • For example, see M.S. Phadke, R.N. Kacker, D.V. Speeney, and M.J. Greico, "Off-Line Quality Control in Integrated Circuit Fabrication Using Experimental Design," Bell System Technical Journal, Vol. 62, No. 5, 1983, pp. 1,273-1,309, or B. Schmidt, H. Dierl, and H. Kaltenbach, "Optimization of IC Chip Bonding Process via Taguchi Methods," in Proceedings of the ASI Fifth Symposium on Taguchi Methods (Dearborn, MI: American Supplier Institute, 1987), pp. 475-485.
    • (1987) Proceedings of the ASI Fifth Symposium on Taguchi Methods , pp. 475-485
    • Schmidt, B.1    Dierl, H.2    Kaltenbach, H.3
  • 3
    • 84889545553 scopus 로고    scopus 로고
    • For example, see M.C. Liu, "A Class Project of Quality Engineering," or M. Lulu, "Integrating Quality and Design: A Case in Circuit Design," in Proceedings of the Third Industrial Engineering Research Conference (IERC) (St. Louis, MO: IERC, 1993), pp. 327-331 and pp. 343-347, respectively.
    • A Class Project of Quality Engineering
    • Liu, M.C.1
  • 4
    • 84889541933 scopus 로고
    • Integrating Quality and Design: A Case in Circuit Design
    • St. Louis, MO: IERC
    • For example, see M.C. Liu, "A Class Project of Quality Engineering," or M. Lulu, "Integrating Quality and Design: A Case in Circuit Design," in Proceedings of the Third Industrial Engineering Research Conference (IERC) (St. Louis, MO: IERC, 1993), pp. 327-331 and pp. 343-347, respectively.
    • (1993) Proceedings of the Third Industrial Engineering Research Conference (IERC) , pp. 327-331
    • Lulu, M.1
  • 6
    • 0023595736 scopus 로고
    • The Taguchi Approach to Parameter Design
    • December
    • D.M. Byrne and S. Taguchi, "The Taguchi Approach to Parameter Design," Quality Progress, December 1987, pp. 19-26.
    • (1987) Quality Progress , pp. 19-26
    • Byrne, D.M.1    Taguchi, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.