SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 300, Issue 1-2, 1997, Pages 78-83

Structural models for epitaxy of hexagonal phases of boron nitride on Si(001)

(1) Verwoerd, W S a,b

a UNIVERSITY OF OTAGO (New Zealand)

b UNIVERSITY OF SOUTH AFRICA (South Africa)

Author keywords

Boron nitride; Epitaxy; Silicon; Structural properties

Indexed keywords

CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS;

HEXAGONAL BORON NITRIDE;

BORON COMPOUNDS;

EID: 0031141148 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)09451-5 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.