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Volumn 175-176, Issue PART 1, 1997, Pages 340-345

In-situ BEEM study of interfacial dislocations and point defects

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON EMISSION; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; POINT DEFECTS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR GROWTH;

EID: 0031141088     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00867-6     Document Type: Article
Times cited : (5)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.