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Volumn 279, Issue 1-2, 1997, Pages 85-94

Low temperature scanning electron microscope measurements on a Nb/Ta junction

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTRON TUNNELING; ENERGY DISSIPATION; LIGHT ABSORPTION; NIOBIUM; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING DEVICES; TANTALUM; X RAYS;

EID: 0031139963     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)00130-5     Document Type: Article
Times cited : (5)

References (18)
  • 9
    • 0039823215 scopus 로고
    • Ph.D. Thesis, Utrecht, the Netherlands
    • J.B. le Grand, Ph.D. Thesis, Utrecht, the Netherlands (1994).
    • (1994)
    • Le Grand, J.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.