Mott-Schottky analysis of nanometer-scale thin-film anatase TiO2

Journal of the Electrochemical Society

Volumn 144, Issue 5, 1997, Pages 1723-1727

  Van De Krol, R ^a   Goossens, A ^a   Schoonman, J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRON BEAMS; THIN FILMS;

ANATASE; ELECTRON BEAM EVAPORATION; MOTT-SCHOTTKY ANALYSIS;

TITANIUM DIOXIDE;

EID: 0031139406     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837668     Document Type: Article

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