Microstructural characterization of 2124 Al-SiCW composite

Scripta Materialia

Volumn 36, Issue 9, 1997, Pages 1045-1051

  Park, W J ^a   Kim, Nack J ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CONSOLIDATION; CRYSTAL WHISKERS; DEGRADATION; DUCTILITY; ELECTRON DIFFRACTION; FRACTURE TOUGHNESS; MECHANICAL PROPERTIES; METALLOGRAPHIC MICROSTRUCTURE; POWDER METALLURGY; SILICON CARBIDE;

COARSE PARTICLE; CONVERGENT BEAM ELECTRON DIFFRACTION; ENERGY DISPERSIVE X RAY SPECTROSCOPY;

METALLIC MATRIX COMPOSITES;

EID: 0031131428     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(97)00008-0     Document Type: Article

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