SCOPUS 정보 검색 플랫폼

Microelectronics Reliability

Volumn 37, Issue 4, 1997, Pages 597-603

Consecutives-k, r-out-of-n:DFM systems

(1) Koutras, M V a

a UNIVERSITY OF ATHENS (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; FAILURE ANALYSIS; INSPECTION; MATHEMATICAL MODELS; NETWORK COMPONENTS; OPTIMIZATION; PROBABILITY; QUALITY CONTROL; RECURSIVE FUNCTIONS; SYSTEMS ANALYSIS;

DUAL FAILURE MODE; RECURRENCE RELATIONS; RECURSIVE FORMULAE;

RELIABILITY;

EID: 0031126493 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(96)00069-8 Document Type: Article

Times cited : (26)

References (11)

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- Barlow, R.E.¹ Hunter, L.C.² Proschan, F.³

2
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4
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- Jenney, B.W.¹ Sherwin, D.J.²

5
- 0024719106
- On a common error in open and short circuit reliability computation
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- Malon, D.M.¹

6
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7
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- Optimal "series-parallel" networks of three-state devices
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- Page, L.B.¹ Perry, J.E.²

8
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9
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- The graphical reliability evaluation of three-state device networks
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10
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11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.