Analysis of a two-unit warm standby system subject to degradation

Microelectronics Reliability

Volumn 37, Issue 4, 1997, Pages 641-647

  Mokaddis, G S ^a   Labib, S W ^a   Ahmed, A M ^a  

^a Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPUTER SOFTWARE; FAILURE ANALYSIS; INTEGRATION; LAPLACE TRANSFORMS; MATHEMATICAL MODELS; PROBABILITY; PROBABILITY DENSITY FUNCTION; RELIABILITY; REPAIR; SYSTEMS ANALYSIS;

MEAN TIME TO SYSTEM FAILURE; MEAN TIME TO SYSTEM RECOVERY; TWO UNIT WARM STANDBY SYSTEM;

STANDBY POWER SYSTEMS;

EID: 0031126492     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00070-4     Document Type: Article

References (9)

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