Magnetization and interface structure of Co/Ti multilayers

Journal of Magnetism and Magnetic Materials

Volumn 168, Issue 1-2, 1997, Pages 43-46

  Wu, Ping ^a   Jiang, E Y ^a   Wang, C D ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Co Ti multilayer; Interface structure; Magnetization; Thickness

Indexed keywords

COBALT; CRYSTAL STRUCTURE; INTERFACES (MATERIALS); MAGNETIZATION; SPUTTERING; TITANIUM; X RAY DIFFRACTION ANALYSIS;

FILM THICKNESS; MAGNETIC MULTILAYERS;

MULTILAYERS;

EID: 0031126110     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(96)00695-6     Document Type: Article

References (8)

1. Chun Li, A.J. Freeman and C.L. Fu, J. Magn. Magn. Mater. 83 (1990) 51.
2. Q. Wang, N. Metoki, Ch. Morawe, Th. Zeidler and H. Zabel, J. Appl. Phys. 78 (1995) 1689.
3. T. Mitsuzuka, A. Kamijo and H. Igarashi, J. Appl. Phys. 68 (1990) 1787.
4. R.V. Leeuwen, C.D. England, J.R. Dutcher, C.M. Falco, W.R. Bennett and B. Hillebrands, J. Appl. Phys. 67 (1990) 4910.
5. Y.H. Liu, Y.M. Zhang, S.S. Yan and X.D. Ma. Phys. Rev. B 48 (1993) 10266.
6. J.L. Murray, Bull. Alloy Phase Diagram 3 (1982) 74.
7. J.R. Childress, C.L. Chien and A.F. Jankowski, Phys. Rev. B 45 (1992) 2855.
8. B.J. Li and L.Y. Zhang, J. Hebei Normal Univ. 19 (1995) 173 (in Chinese).