The design of rotation-invariant pattern recognition using the silicon retina

IEEE Journal of Solid-State Circuits

Volumn 32, Issue 4, 1997, Pages 526-533

  Chiu, Chin Fong ^a,b   Wu, Chung Yu ^a,c  

^a IEEE   (Taiwan)

^b National Science Council   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Circular harmonic transformation; Rotation invariant; Silicon retina

Indexed keywords

CIRCULAR HARMONIC TRANSFORMATION; CORRELATION FUNCTION; EXTRA EDGE DETECTOR; IMAGE SENSING; PATTERN RECOGNITION SYSTEM DESIGN; ROTATION INVARIANT; SILICON RETINA;

CMOS INTEGRATED CIRCUITS; CORRELATION METHODS; EDGE DETECTION; ERROR ANALYSIS; FEATURE EXTRACTION; HARMONIC ANALYSIS; IMAGE PROCESSING; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL TRANSFORMATIONS; VLSI CIRCUITS;

PATTERN RECOGNITION SYSTEMS;

EID: 0031125929     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.563674     Document Type: Article

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