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Volumn 32, Issue 4, 1997, Pages 598-603
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Substrate coupling evaluation in BiCMOS technology
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Author keywords
Crosstalk minimization; Noise in BiCMOS circuits; Substrate coupling
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Indexed keywords
BIPOLAR INTEGRATED CIRCUITS;
BIPOLAR TRANSISTORS;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
CROSSTALK;
ELECTRIC RESISTANCE;
GATES (TRANSISTOR);
MESFET DEVICES;
SEMICONDUCTING FILMS;
SEMICONDUCTOR DOPING;
SPURIOUS SIGNAL NOISE;
SUBSTRATES;
BICMOS TECHNOLOGY;
BIPOLAR JUNCTION TRANSISTORS;
BURIED LAYER DOPING;
CROSSTALK MINIMIZATION;
SUBSTRATE COUPLING;
SWITCHING NOISE;
TRANSISTOR BIASING;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0031125414
PISSN: 00189200
EISSN: None
Source Type: Journal
DOI: 10.1109/4.563684 Document Type: Article |
Times cited : (26)
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References (7)
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