Versatile objective lens with adjustable correction for different wavelengths and substrate thicknesses for testing optical disks

Applied Optics

Volumn 36, Issue 11, 1997, Pages 2414-2420

  Gerber, Ronald E ^a   Mansuripur, M ^b   Sasián, José M ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTROMAGNETIC WAVE DIFFRACTION; GAS LASERS; LASER BEAM EFFECTS; OPTICAL COATINGS; OPTICAL DESIGN; OPTICAL DISK STORAGE;

ADJUSTABLE COLLARS; ASPHERIC SINGLET; MICROSCOPE OBJECTIVE; SPHEROCHROMATISM;

LENSES;

EID: 0031125303     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.002414     Document Type: Article

References (2)

1. N. Mushiake, “Interferometrie measurement of finite conjugate optical systems, ” M. S. thesis (Optical Sciences Center, University of Arizona, 1993).
2. R. E. Gerber and M. Mansuripur, “Tilt correction in an optical disk system, ” Appl. Opt. 35, 7000-7007 (1996).