Processing and characterization of PbS nanocrystallites in TMOS silica xerogels

Materials Research Bulletin

Volumn 32, Issue 4, 1997, Pages 397-408

  Parvathy, N N ^a   Pajonk, G M ^b   Venkateswara Rao, A ^a  

^a SHIVAJI UNIVERSITY   (India)

^b INST DE RECHERCHES SUR LA CATALYSE   (France)

Author keywords

A. semiconductors; B. sol gel chemistry; C. X ray diffraction; D. crystal structure; D. optical properties

Indexed keywords

CATALYSTS; CHEMISTRY; CRYSTAL STRUCTURE; DOPING (ADDITIVES); HYDROLYSIS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; POLYCONDENSATION; SEMICONDUCTOR MATERIALS; SOL-GELS; THERMAL EFFECTS; X RAY DIFFRACTION;

CRYSTALLITES; LEAD NITRATE; TETRAMETHOXYSILANE SILICA XEROGEL; THIOUREA; THRESHOLD ABSORPTION PEAK;

SILICA GEL;

EID: 0031125103     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(97)00004-4     Document Type: Article

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