Loading effects in resistance scaling

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 322-324

  Elmquist, Randolph E ^a,b   Dziuba, Ronald F ^a,b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYOGENICS; ELECTRIC CURRENT MEASUREMENT; RESISTORS; THERMAL EFFECTS;

CRYOGENIC CURRENT COMPARATOR RATIO MEASUREMENTS;

ELECTRIC RESISTANCE MEASUREMENT;

EID: 0031124929     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571847     Document Type: Article

References (5)

1. A. F. Dunn, "Increased accuracy for resistance measurements," IEEE Trans. Instrum. Meas., vol. IM-15, pp. 220-226, Dec. 1966.
2. R. F. Dziuba and R. E. Elmquist, "Improvements in resistance scaling at NIST using cryogenic current comparators," IEEE Trans. Instrum. Meas., vol. 42, pp. 126-130, Apr. 1993.
3. A.-M. Jeffery, R. E. Elmquist, L. H. Lee, J. Q. Shields, and R. F. Dziuba, "NIST comparison of the quantized Hall resistance and the realization of the SI ohm through the calculable capacitor," this issue, pp. 264-268.
4. M. E. Cage, R. F. Dziuba, C. T. Van Degrift, and Dingyi Yu, "Determination of the time-dependence of ΩNBS using the quantized Hall resistance," IEEE Trans. Instrum. Meas., vol. 38, pp. 263-269, Apr. 1989.
5. J. Q. Shields, R. F. Dziuba, and H. P. Layer, "New realization of the ohm and Farad using the NBS calculable capacitor," IEEE Trans. Instrum. Meas., vol. 38, pp. 349-351, Apr. 1989.