Local structure of ion-bombarded α-SiC analyzed by EXAFS

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Borowski, M ^a   Bolse, W ^b   Conrad, J ^b  

^a SYNCHROTRON SOLEIL   (France)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ION BOMBARDMENT; PHASE TRANSITIONS; RADIATION EFFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

SILICON CARBIDE;

EID: 0031124884     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1997215     Document Type: Article

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