An in situ reflection mode quick scanning EXAFS study of anodic oxide layer formation on silver

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Hecht, D ^a   Borthen, P ^a   Frahm, R ^b   Strehblow, H H ^a  

^a HEINRICH HEINE UNIVERSITY   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANODES; ELECTRIC CURRENTS; FILM GROWTH; LIGHT REFLECTION; SILVER; SURFACE STRUCTURE; TRANSIENTS; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; POTENTIOSTATIC CURRENT TRANSIENTS;

OXIDES;

EID: 0031124808     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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