In-situ growth studies of sputtered YBCO thin films by spectroscopic ellipsometry

Journal of Alloys and Compounds

Volumn 251, Issue 1-2, 1997, Pages 15-18

  Bijlsma, M E ^a   Blank, D H A ^a   Wormeester, H ^a   Van Silfhout, A ^a   Rogalla, H ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Spectroscopic ellipsometry; Sputtered YBCO thin films

Indexed keywords

CRYSTAL ORIENTATION; ELLIPSOMETRY; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; NUCLEATION; OXIDE SUPERCONDUCTORS; PRESSURE EFFECTS; SPECTROSCOPIC ANALYSIS; SPUTTER DEPOSITION; SUPERCONDUCTIVITY; THERMAL EFFECTS; YTTRIUM COMPOUNDS;

SPECTROSCOPIC ELLIPSOMETRY; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0031124735     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(96)02761-2     Document Type: Article

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