Precision volume measurements on silicon spheres

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 584-587

  Sacconi, Attilio ^a   Panciera, Renzo ^a   Pasin, Walter ^a  

^a Istituto di Metrologia Gustavo Colonnetti   (Italy)

Author keywords

Avogadro constant; Roundness; Silicon; Sphere; Thermal expansion; Volume standard

Indexed keywords

DENSITY MEASUREMENT (SPECIFIC GRAVITY); INTERFEROMETRY; SPHERES; THERMAL EXPANSION; VOLUME MEASUREMENT;

AVOGADRO'S CONSTANT;

SILICON;

EID: 0031124264     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571924     Document Type: Article

References (9)

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