Current-voltage characteristics and layer coupling in amorphous W/Si multilayers

Physica C: Superconductivity and its Applications

Volumn 277, Issue 1-2, 1997, Pages 138-144

  Matsuo, Y ^a   Nojima, T ^a   Kuwasawa, Y ^a   Majkova E ^b   Luby, S ^b  

^a CHIBA UNIVERSITY   (Japan)

^b INSTITUTE OF PHYSICS   (Slovakia)

Author keywords

Amorphous W Si multilayers; I V characteristics; Kosterlitz Thouless transition; Layer coupling

Indexed keywords

AMORPHOUS FILMS; CURRENT VOLTAGE CHARACTERISTICS; SEMICONDUCTING SILICON; TUNGSTEN;

KOSTERLITZ-THOULESS TRANSITION; LAYER COUPLING;

METALLIC SUPERLATTICES;

EID: 0031123927     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)00050-6     Document Type: Article

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