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Volumn 33, Issue 9, 1997, Pages 759-760

OBDD-based network reliability calculation

Author keywords

Reliability theory

Indexed keywords

ALGORITHMS; BOOLEAN FUNCTIONS; CALCULATIONS; DECISION THEORY; FAILURE ANALYSIS; GRAPH THEORY; HEURISTIC METHODS; PROBABILITY; RECURSIVE FUNCTIONS; RELIABILITY THEORY;

EID: 0031123823     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19970549     Document Type: Article
Times cited : (15)

References (5)
  • 1
    • 84941446735 scopus 로고
    • Computational complexity of network reliability analysis: An overview
    • BALL, M.O.: 'Computational complexity of network reliability analysis: an overview', IEEE Trans., 1986, R-35, pp. 230-239
    • (1986) IEEE Trans. , vol.R-35 , pp. 230-239
    • Ball, M.O.1
  • 2
    • 0026172999 scopus 로고
    • Factoring and reduction for networks with imperfect vertices
    • THEOLOGOU, O.R., and CARLIER, J.G.: 'Factoring and reduction for networks with imperfect vertices', IEEE Trans. Reliability, 1991, 40, pp. 210-217
    • (1991) IEEE Trans. Reliability , vol.40 , pp. 210-217
    • Theologou, O.R.1    Carlier, J.G.2
  • 3
    • 0027558205 scopus 로고
    • Experimental results on preprocessing of path/ cut term in the sum of disjoint products technique
    • SOH, S., and RAI, S.: 'Experimental results on preprocessing of path/ cut term in the sum of disjoint products technique', IEEE Trans. Reliability, 1993, 42, pp. 24-33
    • (1993) IEEE Trans. Reliability , vol.42 , pp. 24-33
    • Soh, S.1    Rai, S.2
  • 4
    • 0022769976 scopus 로고
    • Graph-based algorithms for Boolean function manipulation
    • BRYANT, R.E.: 'Graph-based algorithms for Boolean function manipulation', IEEE Trans., 1986, C-35, (8), pp. 677-691
    • (1986) IEEE Trans. , vol.C-35 , Issue.8 , pp. 677-691
    • Bryant, R.E.1
  • 5
    • 0029368413 scopus 로고
    • OBDD variable ordering by interleaving compacted clusters
    • YEH, F.-M., and LIN, C.-S.: 'OBDD variable ordering by interleaving compacted clusters', Electron. Lett., 1995, 31, pp. 1724-1725
    • (1995) Electron. Lett. , vol.31 , pp. 1724-1725
    • Yeh, F.-M.1    Lin, C.-S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.