Determination of spin- and valley-split energy levels in strained Si quantum wells

Semiconductor Science and Technology

Volumn 12, Issue 4, 1997, Pages 384-388

  Koester, S J ^a   Ismail, K ^a   Chu, J O ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; MAGNETIC FIELD MEASUREMENT; MAGNETORESISTANCE; SEMICONDUCTING SILICON;

ELECTRON LANDE G FACTOR; SPIN AND VALLEY SPLIT ENERGY LEVELS;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0031123806     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/12/4/007     Document Type: Article

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