Relationship between electrical transport and hole concentration in YBa2Cu3O7-x, ultrathin films probed by electric fields

Journal of Applied Physics

Volumn 81, Issue 7, 1997, Pages 3237-3242

  Auer, R ^a   Schneider, R ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; ELECTRON TRANSPORT PROPERTIES; FIELD EFFECT TRANSISTORS; MASKS; OXIDE SUPERCONDUCTORS; POLARIZATION; PULSED LASER APPLICATIONS; SUPERCONDUCTING TRANSITION TEMPERATURE;

DIELECTRIC POLARIZATION; ELECTRICAL TRANSPORT; FREE CARRIER MODEL; HOLE CONCENTRATION; PULSED LASER DEPOSITION; TRILAYER SYSTEMS; WEAK LINKS;

SUPERCONDUCTING FILMS;

EID: 0031123740     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364156     Document Type: Article

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