X-ray diffraction and EXAFS studies of silicate glasses containing Mg, Ca and Ba atoms

Journal of Non-Crystalline Solids

Volumn 211, Issue 1-2, 1997, Pages 56-63

  Taniguchi, T ^a,b   Okuno, M ^a   Matsumoto, T ^a  

^a KANAZAWA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CALCIUM COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; MAGNESIUM COMPOUNDS; SILICATES; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION ANALYSIS;

COORDINATION NUMBERS; DEBYE WALLER FACTORS; EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) MEASUREMENTS; MODIFIER IONS;

GLASS;

EID: 0031123063     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(96)00632-1     Document Type: Article

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