XAFS measurements on Co-K and Pt-LIII edges in (111) CoPt3 films

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Meneghini, C ^a,b   Maret, M ^c   Cadeville, M C ^c   Hazemann, J L ^d  

^a INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^b INFM   (Italy)

^c INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTAL ORIENTATION; MAGNETIC ANISOTROPY; THIN FILMS; X RAY SPECTROSCOPY;

PREFERENTIAL HETEROATOMIC PAIRS; X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY;

PLATINUM ALLOYS;

EID: 0031122893     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:19972151     Document Type: Article

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