Electrodeposition and characterization of thallium (III) oxide films

Thin Solid Films

Volumn 298, Issue 1-2, 1997, Pages 156-159

  Liu, Jun Fu ^a   Wang, Shi Xun ^a   Yang, Kong Zhang ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

Conductivity; Crystallinity; Electrodeposition; Nanoparticles; Thallium(III) oxide

Indexed keywords

AMORPHIZATION; AMORPHOUS FILMS; CRYSTAL ORIENTATION; CURRENT DENSITY; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRODEPOSITION; INDIUM COMPOUNDS; METALLIC SUPERLATTICES; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; THALLIUM COMPOUNDS; X RAY CRYSTALLOGRAPHY;

INDIUM TIN OXIDE; THALLIUM OXIDE;

CONDUCTIVE FILMS;

EID: 0031122551     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09169-9     Document Type: Article

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