Determination of trace impurities in high-purity quartz by electrothermal vaporization inductively coupled plasma mass spectrometry using the slurry sampling technique

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 4, 1997, Pages 421-428

  Hauptkorn, Susanne ^a   Krivan, Viliam ^a   Gercken, Berthold ^b   Pavel, Jiri ^b  

^a UNIVERSITY OF ULM   (Germany)

^b NOVARTIS PHARMA AG   (Switzerland)

Author keywords

Electrothermal vaporization; Inductively coupled plasma mass spectrometry; Quartz; Slurry sampling; Tungsten coil furnace

Indexed keywords

ELECTRIC FURNACES; FLOW OF FLUIDS; IMPURITIES; PLASMA APPLICATIONS; QUARTZ; SAMPLING; SLURRIES; STANDARDIZATION; TEMPERATURE; TRACE ELEMENTS; VAPORIZATION;

DETECTION LIMITS; ELECTROTHERMAL VAPORIZATION; INDUCTIVELY COUPLED PLASMA; SLURRY SAMPLING TECHNIQUE; TUNGSTEN COIL FURNACE;

MASS SPECTROMETRY;

EID: 0031122517     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a606027g     Document Type: Article

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