Imaging scatterer planes by photoelectron diffraction

Surface Science

Volumn 377-379, Issue , 1997, Pages 1094-1100

  Seelmann Eggebert, M ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

Author keywords

Alpha Sn; CHRISDA; Photoelectron holography; XPD

Indexed keywords

ALGORITHMS; AUGER ELECTRON SPECTROSCOPY; CADMIUM COMPOUNDS; ELECTRON DIFFRACTION; HOLOGRAPHY; IMAGING TECHNIQUES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; TIN; X RAY CRYSTALLOGRAPHY;

PHOTOELECTRON HOLOGRAPHY; REAL SPACE TRIANGULATION; SINGLE CORE LEVEL PHOTOEMISSION;

SURFACE STRUCTURE;

EID: 0031122473     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01555-5     Document Type: Article

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