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Volumn 144, Issue 4, 1997, Pages 1399-1410
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Deposition uniformity, particle nucleation, and the optimum conditions for chemical vapor deposition in multiwafer furnaces
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION;
LAGRANGE MULTIPLIERS;
NUCLEATION;
OPTIMIZATION;
SILICON WAFERS;
TRANSPORT PROPERTIES;
DEPOSITION RATE;
DEPOSITION UNIFORMITY;
OPTIMUM PRESSURE;
OPTIMUM TEMPERATURE;
PARTICLE NUCLEATION;
CHEMICAL VAPOR DEPOSITION;
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EID: 0031122458
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1837602 Document Type: Article |
Times cited : (2)
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References (24)
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