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Volumn 144, Issue 4, 1997, Pages 1399-1410

Deposition uniformity, particle nucleation, and the optimum conditions for chemical vapor deposition in multiwafer furnaces

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; LAGRANGE MULTIPLIERS; NUCLEATION; OPTIMIZATION; SILICON WAFERS; TRANSPORT PROPERTIES;

EID: 0031122458     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837602     Document Type: Article
Times cited : (2)

References (24)
  • 1
    • 0024902758 scopus 로고
    • Advances in Chemistry, Series 221, American Chemical Society, Washington, DC
    • D. W. Hess and K. F. Jensen, Microelectronics Processing, p. 1, Advances in Chemistry, Series 221, American Chemical Society, Washington, DC (1989).
    • (1989) Microelectronics Processing , pp. 1
    • Hess, D.W.1    Jensen, K.F.2
  • 20
    • 0004223695 scopus 로고
    • Addison-Wesley, Reading, MA
    • W. Kaplan, Advanced Calculus, p. 184. Addison-Wesley, Reading, MA (1973).
    • (1973) Advanced Calculus , pp. 184
    • Kaplan, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.