Development of thin-film multijunction thermal converters at NIST

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 347-351

  Kinard, Joseph R ^a,b   Novotny, Donald B ^a,b   Lipe, Thomas E ^a,b   Huang, De Xiang ^c  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Ballantine Laboratories Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; FABRICATION; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SOCIETIES AND INSTITUTIONS; THIN FILM DEVICES;

THIN FILM MULTIJUNCTION THERMAL CONVERTERS;

ELECTRIC CONVERTERS;

EID: 0031122197     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571853     Document Type: Article

References (9)

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