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Volumn 48, Issue 2, 1997, Pages 124-128

Thick (δ ≥ 300 nm) WS2 films obtained on unpolished glass substrates

Author keywords

Electrical conductivity; Thick films; WS2; XPS analysis

Indexed keywords

CRYSTAL STRUCTURE; GLASS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; POLISHING; SULFUR COMPOUNDS; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031122140     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(97)80105-8     Document Type: Article
Times cited : (3)

References (11)
  • 1
    • 0008145066 scopus 로고
    • H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud (eds.), Scitec, Switzerland
    • A. Jager-Waldau, M.Ch. Lux-Steiner and E. Bucher, in H.P. Strunk, J.H. Werner, B. Fortin and O. Bonnaud (eds.), Solid State Phenomena, Vols. 37-38, Scitec, Switzerland, 1994, p. 479.
    • (1994) Solid State Phenomena , vol.37-38 , pp. 479
    • Jager-Waldau, A.1    Lux-Steiner, M.Ch.2    Bucher, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.