Simultaneously measuring temperature and strain using optical fiber microcavities

Journal of Lightwave Technology

Volumn 15, Issue 4, 1997, Pages 647-653

  Singh, Harmeet ^a   Sirkis, James S ^b  

^a 3M COMPANY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; ETALONS; FABRY-PEROT INTERFEROMETERS; STRAIN MEASUREMENT; TEMPERATURE MEASUREMENT;

COHERENCE DIVISION MULTIPLEXING; INLINE FIBER ETALONS (ILFE); LIGHT INTERFEROMETRY; OPTICAL FIBER MICROCAVITIES;

FIBER OPTIC SENSORS;

EID: 0031122078     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.566686     Document Type: Article

References (16)

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