Growth of Sn thin films on CdTe(111)

Surface Science

Volumn 377-379, Issue , 1997, Pages 904-908

  Zimmermann, H ^a   Keller, Robert C ^b   Meisen, P ^a   Seelmann Eggebert, M ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

ARXPS; CdTe; Contact; Interface intermixing; XPD; Tin

Indexed keywords

ELECTRON DIFFRACTION; FILM GROWTH; INTERFACES (MATERIALS); SEMICONDUCTING CADMIUM COMPOUNDS; THIN FILMS; TIN; X RAY SPECTROSCOPY;

ANGLE RESOLVED X RAY PHOTOEMISSION SPECTROSCOPY (ARXPS); INTERFACE INTERMIXING; X RAY PHOTOELECTRON DIFFRACTION (XPD);

METALLIC FILMS;

EID: 0031121711     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01519-1     Document Type: Article

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